Compound SemiconductorLehighton
1. Non-contact measurement
> Carrier Mobility
> Carrier Density
> Carrier Concentration
> sheet resistivity
2. 2"~8" wafers and flat panel
3. GaAs, GaN, SiGe, InP, Si, etc.
4. Semi-auto or filly automatical
5. Time saving:
> no need to cut the sample
> no need to connecting conducting wire
6. Measurement under room temp
7. Good repeatability